Experts discuss ‘Evolution of Smart Appliances and Devices’ during the International Mobile and Embedded Technology Conference, MECON-2022 at Amity University
Amity School of Engineering and Technology, Amity University Uttar Pradesh, Noida Campus has organized International Mobile and Embedded Technology Conference, MECON-2022 on the theme ‘Evolution in Smart Appliances and Devices’ in Virtual Mode.
MECON-2022 aims to bring together professionals, academics, industry experts and researchers to discuss various emerging trends and innovations, share research findings and provide new directions for the next generation of technologies. The conference was attended by more than 40 prominent international experts and speakers from the United States, United Kingdom, Australia, Canada, France, Malaysia, Germany, Sweden, Singapore, Germany, Italy, Portugal, Japan, Hong Kong, Taiwan, UAE and India, and IEEE. . Fellows of leading universities in India and abroad. The conference was co-sponsored by the Institute of Electrical and Electronics Engineers, IEEE UP Section (India), IEEE Antenna and Propagation Society and IEEE Technical Council on RFID, IEEE Delhi Section.
During the two-day conference, honorary professorships were awarded by Amity University, Prof. Ashok Agrawala, University of Maryland, USA, Prof. Manas M. Tengeris, Georgia Institute of Technology, USA, Professor Timothy and Farrell, University of Sheffield. , UK, Dr. Anthony Giotto, Bordeaux Institute of Technology, France and Professor Giulio Antonini, University of L’Aquila, Italy. More than 350 research papers were presented by researchers and scholars from Amity University and Technical Sessions, including ‘A Novel Learning Automated-Based Controller Placement Scheme for Software-Defined Network Systems’,’ We’ve Transformed Artificial Intelligence: Today ‘,’ Deep Learning Acceleration Techniques for Embedded and Mobile Visual Applications’, ‘Information Dynamics – Integrating Information and Systems’ and’ Novel Wireless Sensor Network Protocol ‘, among others.